The Coordinate Metrology Society (CMS), the membership association for measurement professionals, has announced its 28th annual Coordinate Metrology Systems Conference (CMSC) will be held in New Orleans, LA, from July 16-20, 2012 at The Roosevelt Hotel. The five-day event offers educational sessions, networking events and the latest in measurement and inspection technology and services. With over 20 white paper presentations each year, the conference explores trends and solutions related to the metrology field. This special event caters to users of portable 3D coordinate measurement solutions utilized on manufacturing factory floors or by science laboratories.

Attendees are quality professionals, both expert and novice metrologists who want to expand their skill sets and knowledge, and manufacturing executives, scientists, students, teachers and more. Online attendee registration is now open at https://www.cmsc.org/register. Conference details for exhibitors can be found at https://www.cmsc.org/cmsc-exhibitor-information.

"The CMSC is the place to make new connections with leaders at the forefront of emerging measurement and inspection trends," said the company. "The conference always offers a full slate of technical paper presentations covering best practices in diverse metrology applications. But the CMSC agenda also includes measurement studies, workshops, standards seminars, user group meetings and networking opportunities."

Lastly, attendees get to see what's new first hand in the CMSC Exhibitor Hall featuring portable measurement systems (PCMMs), software, accessories, peripherals and inspection and measurement services. PCMM technology displayed at the conference includes industrial photogrammetry solutions, laser trackers, laser radars, articulating arms, GPS systems, laser scanners, laser projection systems theodolites and much more.

For more information contact:

CMSC

1404 Timberline Drive

Benbrook, TX 76126

425-802-5720

www.cmsc.org