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X-Ray Fluorescence Technology for Coatings



FISCHERSCOPE X-RAY XDV-SDD is a high performance X-ray measuring instrument with a programmable X/Y-stage and Z-axis for automated measurements of very thin coatings and composition of NiP layers.

Fischer Technology has announced the capability of non-destructive simultaneous measurement of phosphorous content and thickness in electroless nickel (NiP) coatings using X-ray Fluorescence Instrumentation (XRF). The phosphorus content of electroless nickel coatings is critical in determining the corrosion and wear resistance, hardness and solderability.

"For the first time this capability is realized for measurements in air (vacuum free), regardless of the underlying base material: AL, Fe, Cu or PCB," said a company spokesperson. "Fischer's high performance XRF hardware, combined with user-friendly advanced fundamental parameter software, allow for fast and accurate results of both coating thickness and phosphorous content at the same time with minimal sample preparation."

A full range of certified and traceable standards are also available from Fischer.

For more information contact:

Fischer Technology, Inc.

750 Marshall Phelps Rd.

Windsor, CT 06095

800-243-8417 / 860-683-0781

info@fischer-technology.com

www.fischer-technology.com

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