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Multi-Purpose Compact CMM, Probe Scanning CMM and Multi-Sensor CMM Software

LK Metrology's Altera "S" will be on display.

LK Metrology's CAMIO multi-sensor CMM software will be on display.

In a partnership with Nikon Metrology, LK Metrology will join Nikon in its booth and feature LK's Altera "S" multi-purpose compact CMM and the Altera "M" high-speed production-type CMM with probe and laser scanning, including applications of Renishaw PH20 and REVO2 probes. All the LK Metrology CMMs will be fitted with CAMIO8 multi-sensor CMM software and Renishaw Modus software. In addition, a CMM robotic cell will feature an Altera "S" equipped with a Nikon L100 laser scanner.

"The Altera 'S' is LK's multi-purpose CMM with the most advanced capabilities in the compact CMM class," said a company spokesperson. The machine is multi-sensor ready, allowing the user to expand the capability of the CMM as requirements change without the need for expensive controller upgrades.

The Altera "M" range of performance CMMs delivers enhanced throughput and enhanced precision for production applications. "Exclusively designed for high-speed tactile probe scanning and laser scanner applications, the Altera `M' is the preferred choice for automotive and aerospace and other manufacturers of performance critical components. By leveraging the productivity benefits of CAMIO8, manufacturers can focus on accelerating lead times and improving product quality while reducing costs. Camio8 features interoperability across CMM platforms, sensor technology and manufacturing sites," added the spokesperson.

For more information contact:

LK Metrology, Inc.

North American Headquarters Facility

12701 Grand River Rd.

Brighton, MI 48116


IMTS 2018 Level 3, Booth E-5060

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