Enhanced Inspection Lineup

Nikon Corporation (Nikon) has announced a comprehensive suite of enhancements to its XT V Series X-ray and CT systems for nondestructive inspection of electronic components. These enhancements enable operators to achieve better image quality, scan heavier samples, and protect sensitive components from electrostatic discharge and radiation damage.

A software enhancement and five hardware enhancements are available as optional upgrades to the XT V Series, allowing customers to customize their systems based on their specific application requirements.

Software enhancement:

• High contrast filter 2.0: Offers clear imaging that ensures defects are visible immediately, for any combination of sample shape and density.

Hardware enhancements:

• Heavy duty tray: Enables larger, heavier parts to be scanned. Operators can scan more parts in each batch and expand inspection capabilities.
• Diamond window: Delivers improved image contrast across the operating range, particularly beneficial for low-density and mixed-material samples, resulting in less noise and faster scans.
• Low-dose collimator: Protects radiation-sensitive electronics, minimizing dose to sensitive parts such as semiconductor devices while enabling safe inspection of larger batches.
• ESD safety upgrade: Provides ESD-safe inspection of sensitive electronic components to IEC 6100-4-2, ANSI/ESD S20.20, and JEDEC JESD625 standards when installed in an ESD-Protected Area (EPA), allowing for confident integration into ESD-safe processes.
• High magnification CT arm: Enables higher magnification CT scans for small samples, allowing operators to see finer details than previously possible.

"The XT V Series continues to excel in electronics inspection applications, including PCBs, BGAs, chips, and semiconductor devices," said a company spokesperson. "The systems maintain their market-leading Xi microfocus X-ray sources and powerful image enhancement capabilities, while the new enhancements provide additional value for customers across electronics manufacturing, semiconductor production, and quality control environments."

Nikon Launches Digital Camera for Microscopes

Nikon has also announced the Digital Sight 100 digital camera for microscopes. The Digital Sight 100 can be used in combination with a full line-up of industrial microscopes and measuring microscopes. The digital camera offers high-definition, high-level color reproducibility, and an efficient workflow from viewing, recording, and sharing information, through the combination with Nikon's NIS-Elements software. The Digital Sight 100 is expected to be used in a wide range of industries where users will be able to take high-quality images and smoothly share information.

Key features:

• High-definition/high-level color reproducibility/high frame rate: When combined with industrial microscopes (FN16), the Digital Sight 100 delivers 6.5-megapixel resolution (2,944 x 2,208 pixels), offering clear capture of fine structural details and rich color information. The camera alone delivers 17.7-megapixel resolution and supports wide-field imaging up to 4,864 x 3,648 pixels (FN25).
• Works on multiple device interfaces: Since it is compatible with USB 3.2, HDMI, Wi-Fi, and ethernet, operators can flexibly operate and share information from the camera even to distant locations.
• Intuitive operability and software integration: Operators can reduce their workloads with easy operations by using the camera with Nikon's NIS-Elements LE software, as well as the latest versions of NIS-Elements AR/BR/D.

For more information contact:

Nikon Metrology, Inc.

12701 Grand River Ave.

Brighton, MI 48116

810-220-4360

sales.nm-us@nikon.com

www.nikonmetrology.com